Outreach

Authorities from the National Metrology Center of Panama and CENAM Mexico visit INAOE

Last Thursday, January 30, authorities from the National Metrology Center of Panama (CENAMEP AIP) and the National Metrology Center in Mexico (CENAM) visited the National Institute of Astrophysics, Optics and Electronics (INAOE), a center of the Secretariat of Science, Humanities, Technology and Innovation (Secihti), with the objective of developing collaborative projects.

The delegation was received by Dr. Julian David Sánchez de la Llave, Acting General Director of INAOE; Dr. Claudia Feregrino Uribe, in charge of the Office of the Affairs of the Directorates of Research and Technological Development; Dr. Luis Hernández Martínez, head of the Deparment of Electronics; Dr. Alfredo Morales, teaching representative of the area; doctors Alfonso Torres Jácome, Mario Moreno Moreno and Mónico Linares Aranda, researchers of Electronics; Dr. Bertha Patricia Guzmán Velázquez, in charge of the Institutional Liaison and Planning Office, and M. C. Janina Nava Ariza, Institutional Liaison.

On behalf of CENAMEN AIP, we had the presence of Mtro. Javier Arias, General Director of the National Metrology Center of Panama, and Eng. Saúl García, Director of Mechanical and Physical Metrology. From CENAM Mexico, Mtro. Gabriel Lugo, responsible for Liaison, attended.

At the meeting, INAOE presented its substantive activities, projects and the MEMS Innovation Laboratory (LIMEMS). CENAM Panama made a presentation of its activities. Perspectives for collaboration were also addressed.

The agenda of the day included visits to the Microelectronics, Electron Microscopy and Aspheric Surfaces laboratories, and to the Schmidt Camera.